In SUSEN Diagnostic centre we analyse materials for Gen IV nuclear reactors which were tested in extreme conditions

The scanning electron microscope located in CVŘ Diagnostic centre is used for the fabrication of thin specimens suitable for analysis on the transmission electron microscope (TEM). The specimens, made by using the focused ion beam (FIB lamellas) in the chamber of the scanning electron microscope, are polished to thickness less than 100 nm. Then they are suitable for further high-resolution TEM analysis by means of crystallographic and chemical methods. Currently, we deal with detailed surface analysis of scpecimens exposed to high-temperature helium, supercritical water as well as liquid metals, as the candidate materials for Gen IV reactors.